Spectroscopic Ellipsometer
Building MXC, EPFL, 1015 Lausanne
General Short Description
Non-destructive optical technique, based on measurement of the change of the polarisation state of light after reflection at non normal incidence on the surface to study
Relevant technical details
Incidence Angle range: >12° to 90°
Optical range: 290 to 990 nm
Applications
Thin Film Optical Characterization
For rental agreement, availability and pricing, please reach out to the contact person